Monday, August 13, 2007

Callibration Services for Nanotechnology Metrology Instruments from CEMMNT

The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) has expanded its measurement, characterisation and design capabilities for industry to provide extensive calibration and test services through its UKAS accredited partners which include the National Physical Laboratory and Ametek Taylor Hobson. CEMMNT delivers a fast turn-around service to re-certify standard samples, calibrate metrology instrumentation and measure components. New standard samples are available for verifying the performance of stylus, optical, scanning probe, coordinate measuring machines and similar instruments. Artefacts, such as 1-D and 2-D grid plates, linescales and graticules, specifically designed for microscopy instruments can be supplied or re-verified.

Customer samples can be calibrated traceably for critical dimensions, texture, straightness and roundness to internationally recognised standards. A wide range of parts and components can be measured calibrated or certified. Optical lenses, flats and spheres can be tested for form, asphericity and flatness. Dimensions can be determined for engineering components including spheres, plugs, rings, gauge blocks and length bars. Equipment such as autocollimators, angle gauges, polygons, instrument tables, clinometers, prisms and telescopes can all be calibrated and certified.

CEMMNT additionally provides services to calibrate metrology instrumentation either at client sites or in partner centres of excellence.

Posted August 1st, 2007, AZoNano™.com - The A to Z of Nanotechnology

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